Stéphane GRAUBY est membre de l’équipe Photonique & Matériaux, thématique Tips and Photons Imaging.

Stéphane GRAUBY - LOMA
Stéphane GRAUBY - LOMA
Techniques de recherche

Techniques de recherche

–          Thermoréflectance

–          Interférométrie

–          Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM).

Thèmes

Thèmes

–          Imagerie thermique optique (thermoréflectance, interférométrie)  sur composants électroniques en fonctionnement

–          Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM), microscopie de dilatation de surface (SJEM).

–          Cartographie de conductivité thermique de matériaux par microscopie thermique à balayage par contraste de conductivité (SThM « pointe chaude »). Application à l’étude de nanomatériaux pour la thermoélectricité.

Collaborations

Collaborations

–          Collaborations nationales : J-C. Batsale (TREFLE, Bx1), L. Béchou (IMS, Bx1), G. Fleury (LCPO, Bx1) E. Rouvière (CEA LITEN,Grenoble), CNES (Toulouse)

–          Collaborations internationales : J. Altet, X. Jordà, X. Perpina (UPC, Barcelone), M. Martin-Gonzalez (IMM, Madrid), A. Shakouri (UC Santa Cruz, USA), A. Cornet (UCL, Louvain-la-Neuve).

Publications

Publications

Liste de mes publications dans Hal Archive



31 documents

Article dans une revue

  • J Michaud, L Béchou, D Veyrié, F Laruelle, S Dilhaire, et al.. Thermal Behavior of High Power GaAs-Based Laser Diodes in Vacuum Environment. IEEE Photonics Technology Letters, Institute of Electrical and Electronics Engineers, 2016, 28 (6), pp.665-668. 〈10.1109/LPT.2015.2504394〉. 〈hal-01343339〉
  • Jérémy Michaud, Pamela Del Vecchio, Laurent Béchou, David Veyrié, Mauro Bettiati, et al.. Precise Facet Temperature Distribution of High- Power Laser Diodes: Unpumped Window Effect. IEEE Photonics Technology Letters, Institute of Electrical and Electronics Engineers, 2015, 27 (9), pp.1002-1005. 〈10.1109/LPT.2015.2405090〉. 〈hal-01155505〉
  • Miguel Muñoz Rojo, Jaime Martín, Stéphane Grauby, Theodorian Borca-Tasciuc, Stefan Dilhaire, et al.. Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale, Royal Society of Chemistry, 2015, 7 (9), pp.4256-4257. 〈10.1039/C5NR90020D〉. 〈hal-01407516〉
  • J. Michaud, G. Pedroza, L. Béchou, L.S. How, O. Gilard, et al.. Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1746-1749. 〈10.1016/j.microrel.2015.06.068〉. 〈hal-01256856〉
  • Miguel Muñoz Rojo, Jaime Mart'In, Stéphane Grauby, Theodorian Borca-Tasciuc, Stefan Dilhaire, et al.. Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale, Royal Society of Chemistry, 2014, 6 (14), pp.7858-7865. 〈10.1039/C4NR00107A〉. 〈hal-01025464〉
  • Josep Altet, José Luis Gonzalez, Didac Gomez, Xavier Perpiñà, Wilfrid Claeys, et al.. Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectronics Journal, Elsevier, 2014, 45 (5), pp.484-490. 〈10.1016/j.mejo.2014.02.009〉. 〈hal-01058582〉
  • M. Muñoz Rojo, Stéphane Grauby, Jean-Michel Rampnoux, O. Caballero-Calero, M. Martin-Gonzalez, et al.. Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy. Journal of Applied Physics, American Institute of Physics, 2013, 113 (5), pp.054308 (1-7). 〈10.1063/1.4790363〉. 〈hal-00805572〉
  • Karim Aissou, Jonah Shaver, Guillaume Fleury, Gilles Pécastaings, Cyril Brochon, et al.. Nanoscale Block Copolymer Ordering Induced by Visible Interferometric Micropatterning: A Route towards Large Scale Block Copolymer 2D Crystals. Advanced Materials, Wiley-VCH Verlag, 2013, 25 (2), pp.213-217. 〈10.1002/adma.201203254〉. 〈hal-00817443〉
  • Stéphane Grauby, Etienne Puyoo, Jean-Michel Rampnoux, Emmanuelle Rouvière, Stefan Dilhaire. Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy. Journal of Physical Chemistry C, American Chemical Society, 2013, 117 (17), pp.9025-9034. 〈10.1021/jp4018822〉. 〈hal-00825416〉
  • Etienne Puyoo, Stéphane Grauby, Jean-Michel Rampnoux, Emmanuelle Rouvière. Scanning thermal microscopy of individual silicon nanowires. Journal of Applied Physics, American Institute of Physics, 2011, 109 (2), pp.024302 (9). 〈10.1063/1.3524223〉. 〈hal-00608844〉
  • Stefan Dilhaire, Gilles Pernot, Gaëtan Calbris, Jean-Michel Rampnoux, Stéphane Grauby. Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology. Journal of Applied Physics, American Institute of Physics, 2011, 110 (11), pp.114314 (1-13). 〈10.1063/1.3665129〉. 〈hal-00668320〉
  • Josep Altet, Diego Mateo, Xavier Perpinya, Stéphane Grauby, Stefan Dilhaire, et al.. Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring. Review of Scientific Instruments, American Institute of Physics, 2011, 82, pp.094902 (4). 〈10.1063/1.3633957〉. 〈hal-00635099〉
  • Eduardo Aldrete-Vidrio, Diego Mateo, Josep Altet, M. Amine Salhi, Stéphane Grauby, et al.. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. Measurement Science and Technology, IOP Publishing, 2010, 21 (7), pp.075104 (10). 〈10.1088/0957-0233/21/7/075104〉. 〈hal-00609286〉
  • Etienne Puyoo, Stéphane Grauby, Jean-Michel Rampnoux, Emmanuelle Rouvière, Stefan Dilhaire. Thermal exchange radius measurement: Application to nanowire thermal imaging. Review of Scientific Instruments, American Institute of Physics, 2010, 81 (7), pp.073701 (1-5). 〈10.1063/1.3455214〉. 〈hal-00505488〉
  • Stéphane Grauby, Amine Salhi, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire. Fast Laser Scanning Imaging System for Surface Displacement Measurements. IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2009, 30 (3), pp.222-224. 〈10.1109/LED.2008.2012177〉. 〈hal-00506112〉
  • J. Altet, E. Aldrete-Vidrio, D. Mateo, A. Salhi, Stéphane Grauby, et al.. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. Review of Scientific Instruments, American Institute of Physics, 2009, 80 (2), pp.026101 (1-3). 〈10.1063/1.3073963〉. 〈hal-00505869〉
  • Stéphane Grauby, Luis-David Patino Lopez, Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, et al.. Joule expansion imaging techniques on microlectronic devices. Microelectronics Journal, Elsevier, 2009, 40 (9), pp.1367-1372. 〈10.1016/j.mejo.2008.04.016〉. 〈hal-00670328〉
  • Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, Xavier Perpiñà, Xavier Jordà, et al.. A Heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits. Measurement Science and Technology, IOP Publishing, 2008, 19 (11), pp.115704 (1-8). 〈10.1088/0957-0233/18/11/115704〉. 〈hal-00719197〉
  • Stéphane Grauby, Amine Salhi, Luis-David Patino Lopez, Wilfrid Claeys, Benoît Charlot, et al.. Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectronics Reliability, Elsevier, 2008, 48 (2), pp.204-211. 〈10.1016/j.microrel.2007.04.008〉. 〈hal-00747235〉
  • Y. Ezzahri, S. Grauby, S. Dilhaire, Jean-Michel Rampnoux, W. Claeys. Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics. Journal of Applied Physics, American Institute of Physics, 2007, 101 (1), pp.7. 〈10.1063/1.2403236〉. 〈hal-01553054〉
  • Younès Ezzahri, Stéphane Grauby, Jean-Michel Rampnoux, Hélène Michel, Gilles Pernot, et al.. Coherent phonons in Si/ SiGe superlattices. Physical Review B : Condensed matter and materials physics, American Physical Society, 2007, 75 (19), pp. 195309. 〈10.1103/PhysRevB.75.195309〉. 〈hal-01535961〉
  • Y. Ezzahri, S. Dilhaire, L. D. Patino-Lopez, S. Grauby, W. Claeys, et al.. Dynamical behavior and cut-off frequency of Si/SiGe microcoolers. Superlattices and Microstructures, Elsevier, 2007, 41 (1), pp.7-16. 〈10.1016/j.spmi.2006.08.006〉. 〈hal-01553053〉
  • S. Grauby, A. Salhi, Jean-Michel Rampnoux, Hélène Michel, W. Claeys, et al.. Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices. Review of Scientific Instruments, American Institute of Physics, 2007, 78 (7), pp.074902 (1-8). 〈10.1063/1.2757473〉. 〈hal-01553046〉

Communication dans un congrès

  • S. Dilhaire, Jean-Michel Rampnoux, Stéphane Grauby, G. Pernot, G. Calbris. Nanoscale Thermal Transport Studied With Heterodyne Picosecond Thermoreflectance. ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Dec 2009, Shanghai, China. pp.451-456, 2010, Mnhmt2009, Vol 2. 〈10.1115/MNHMT2009-18338〉. 〈hal-01554476〉
  • S. Grauby, A. Salhi, Jean-Michel Rampnoux, W. Claeys, S. Dilhaire. Laser Scanning Thermomechanical Imaging of Microelectronic Devices. Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on, Sep 2008, Rome, Italy. pp.183-189, 2008, 〈10.1109/THERMINIC.2008.4669905〉. 〈hal-01553682〉
  • S. Grauby, L.-D. Patino Lopez,, A. Salhi, E. Puyoo, J.-M. Rampnoux, et al.. Joule Expansion Imaging Techniques on Microlectronic Devices. THERMINIC 2007, Sep 2007, Budapest, Hungary. EDA Publishing, pp.174-179, 2007. 〈hal-00202556〉
  • Stéphane Grauby, A. Salhi, S. Dilhaire, L.D. Patino Lopez, B. Charlot, et al.. Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques. THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. TIMA Editions, pp.284-289, 2005. 〈hal-00189487〉
  • Y. Ezzahri, Stéphane Grauby, S. Dilhaire, Jean-Michel Rampnoux, W. Claeys, et al.. Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique. THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. TIMA Editions, pp.235-243, 2005. 〈hal-00189478〉
  • Stéphane Grauby, A. Salhi, W. Claeys, D. Trias, S. Dilhaire. ElectroStatic Discharge fault localization by laser probing. 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct 2005, Bordeaux, France. Pergamon-Elsevier Science Ltd, Microelectronics Reliability, 45 (9-11), pp.1482-1486, 2005, 〈10.1016/j.microrel.2005.07.038〉. 〈hal-01552716〉
  • S. Dilhaire, A. Salhi, Stéphane Grauby, W. Claeys. Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. 14th European Symposium on Raliability of Electron Devices, Failure Physics and Analysis (ESREF 2003), Oct 2003, Bordeaux, France. Pergamon-Elsevier Science Ltd, Microelectronics Reliability, 43 (9-11), pp.1609-1613, 2003, 〈10.1016/s0026-2714(03)00282-8〉. 〈hal-01550922〉

Poster

  • Aymen Ben Amor, M. Fakhfakh, C. Renard, Stefan Dilhaire, Laetitia Vincent, et al.. Thermal conductivity reduction measurement on Ge and Si NWs: heterostructuration and diameter size effect.. 15ème Colloque de la Société Française des Microscopies, Jul 2017, Bordeaux, France. 〈http://www.sfmu.fr/〉. 〈hal-01700572〉

1. S. Grauby, B.C. Forget, S. Holé and D. Fournier, Review of Scientific Instruments 70, 3603-3608 (1999).

2. S. Dilhaire, S. Grauby, S. Jorez, L.D. Patino Lopez, J-M. Rampnoux and W. Claeys, Applied Optics 41, 4996-5001 (2002).

3. S. Dilhaire, S. Grauby and W. Claeys, Applied Physics Letters 84, 822-824 (2004).

4. S. Grauby, S. Dilhaire, S. Jorez and W. Claeys, IEEE Electron Device Letters 26, 78-80 (2005).

5. S. Grauby, A. Salhi, J-M. Rampnoux, H. Michel, W. Claeys and S. Dilhaire, Review of Scientific Instruments 78, 074902 (2007).

6. S. Grauby, A. Salhi, J-M. Rampnoux, W. Claeys and S. Dilhaire, IEEE Electron Device Letters 30, 222-224 (2009).

7. E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière and S. Dilhaire, Review of Scientific Instruments 81, 073701 (2010).

8. E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière and S. Dilhaire, Journal of Applied Physics 109, 024302 (2011).

9. K. Aissou, J. Shaver, G. Fleury, G. Pécastaings, C. Brochon, C. Navarro, S. Grauby, J-M. Rampnoux, S. Dilhaire and G. Hadziioannou, Advanced Materials 25, 213-217 (2013).

10. M. Munoz Rojo, S. Grauby, J-M. Rampnoux, O. Caballero-Calero, M. Martin-Gonzalez, and S. Dilhaire, Journal of Applied Physics 113, 054308 (2013).

11. S. Grauby, E. Puyoo, J-M. Rampnoux, E. Rouvière, and S. Dilhaire, Journal of Physical Chemistry C 117, 9025 (2013).

12. M. Munoz Rojo, J. Martin, S. Grauby, T. Borca-Tasciuc, S. Dilhaire and M. Martin-Gonzalez, “Decrease in Thermal Conductivity in Polymeric P3HT Nanowires by Size-Reduction induced by Crystal Orientation: New Approaches towards Organic Thermal Transport Engineering”, Nanoscale, DOI: 10.1039/C4NR00107A (2014).

Curriculum vitae

Curriculum vitae

1. Trajectoire professionnelle

  • Fonction actuelle : maître de conférences HDR, Bordeaux 1, 63ème section, 6ème échelon (classe normale).
  • 1999-2000 : ATER Paris 11.

2. Cursus et diplômes universitaires

  • 1993-1996 : Ecole d’ingénieurs, ENST (Télécom Paris).
  • 1995-1996 : DEA Electronique, option optoélectronique et microondes, Paris 6/ENST, Mention Bien.
  • Thèse : Université Paris 6/ENST, soutenue le 20/01/2000,

Titre : Imagerie photothermique de photoréflectance haute fréquence utilisant une caméra CCD visible couplée à une détection synchrone multiplexée.

  • Habilitation à diriger des recherches : Université Bordeaux 1, soutenue le 26/09/2011,

Titre :    Imagerie thermique (optique et à sonde locale) : du microsystème au nanomatériau.

3. Activités de recherche

  • Activités pluridisciplinaires : instrumentation, optique, électronique, thermique, matériaux.
  • Thèmes de recherche :

–          Imagerie thermique optique (thermoréflectance, interférométrie)

–          Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM), microscopie de dilatation de surface (SJEM).

–          Cartographie de conductivité thermique de matériaux par microscopie thermique à balayage par contraste de conductivité (SThM « pointe chaude »). Application à l’étude de nanomatériaux pour la thermoélectricité.

4. Activités d’enseignement et d’encadrement

  • Enseignement en DUT GEII (Génie Electrique et Informatique Industrielle) 1ère et 2ème année, service annuel moyen : 250 heures. Matières enseignées : cours et TD de physique pour les électroniciens (électrostatique, magnétisme, physique des semi-conducteurs, optoélectronique, propagation hyperfréquences) et TP d’électronique analogique et numérique.
  • Co-responsable de la licence professionnelle « Métiers de la Microélectronique et des Microsystèmes ».

Stéphane GRAUBY

Stéphane GRAUBY

Laboratoire Ondes et Matière d’Aquitaine (LOMA)
351 cours de la libération
33405 Talence Cedex

Phone : + 33 (0)5 40 00 25 09
Fax : + 33 (0)5 40 00 69 70
E-mail:stephane.grauby@u-bordeaux.fr