Stéphane GRAUBY

Stéphane GRAUBY est membre de l’équipe Photonique & Matériaux, thématique Tips and Photons Imaging.

Techniques de recherche Thèmes Collaborations Publications Curriculum vitae

Techniques de recherche

– Thermoréflectance

– Interférométrie

– Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM).

Thèmes

– Imagerie thermique optique (thermoréflectance, interférométrie) sur composants électroniques en fonctionnement

– Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM), microscopie de dilatation de surface (SJEM).

– Cartographie de conductivité thermique de matériaux par microscopie thermique à balayage par contraste de conductivité (SThM « pointe chaude »). Application à l’étude de nanomatériaux pour la thermoélectricité.

Collaborations

– Collaborations nationales : J-C. Batsale (TREFLE, Bx1), L. Béchou (IMS, Bx1), G. Fleury (LCPO, Bx1) E. Rouvière (CEA LITEN,Grenoble), CNES (Toulouse)

– Collaborations internationales : J. Altet, X. Jordà, X. Perpina (UPC, Barcelone), M. Martin-Gonzalez (IMM, Madrid), A. Shakouri (UC Santa Cruz, USA), A. Cornet (UCL, Louvain-la-Neuve).

Publications

Liste de mes publications dans Hal Archive

63 documents

Articles dans une revue46 documents

Stéphane Grauby, Aymen Ben Amor, Géraldine Hallais, Laetitia Vincent, Stefan A Dilhaire. Imaging Thermoelectric Properties at the Nanoscale. Nanomaterials, 2021, 11 (5), pp.1199. ⟨10.3390/nano11051199⟩. ⟨hal-03215364⟩
A. Zenji, Jean-Michel Rampnoux, S. Grauby, S. Dilhaire. Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR). Journal of Applied Physics, 2020, 128 (6), pp.065106. ⟨10.1063/5.0015391⟩. ⟨hal-03005610⟩
Aymen Ben Amor, Doriane Djomani, Mariam Fakhfakh, Stefan Dilhaire, Laetitia Vincent, et al.. Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction. Nanotechnology, 2019, 30 (37), pp.375704. ⟨10.1088/1361-6528/ab29a6⟩. ⟨hal-02174973⟩
J Michaud, L Béchou, D Veyrié, F Laruelle, S Dilhaire, et al.. Thermal Behavior of High Power GaAs-Based Laser Diodes in Vacuum Environment. IEEE Photonics Technology Letters, 2016, 28 (6), pp.665-668. ⟨10.1109/LPT.2015.2504394⟩. ⟨hal-01343339⟩
J. Michaud, G. Pedroza, L. Béchou, L.S. How, O. Gilard, et al.. Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. Microelectronics Reliability, 2015, 55 (9-10), pp.1746-1749. ⟨10.1016/j.microrel.2015.06.068⟩. ⟨hal-01256856⟩
Jérémy Michaud, Pamela del Vecchio, Laurent Béchou, David Veyrié, Mauro Bettiati, et al.. Precise Facet Temperature Distribution of High- Power Laser Diodes: Unpumped Window Effect. IEEE Photonics Technology Letters, 2015, 27 (9), pp.1002-1005. ⟨10.1109/LPT.2015.2405090⟩. ⟨hal-01155505⟩
Miguel Muñoz Rojo, Jaime Martín, Stéphane Grauby, Theodorian Borca-Tasciuc, Stefan Dilhaire, et al.. Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale, 2015, 7 (9), pp.4256-4257. ⟨10.1039/C5NR90020D⟩. ⟨hal-01407516⟩
Miguel Muñoz Rojo, Jaime Mart'In, Stéphane Grauby, Theodorian Borca-Tasciuc, Stefan Dilhaire, et al.. Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale, 2014, 6 (14), pp.7858-7865. ⟨10.1039/C4NR00107A⟩. ⟨hal-01025464⟩
Josep Altet, José Luis Gonzalez, Didac Gomez, Xavier Perpiñà, Wilfrid Claeys, et al.. Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectronics Journal, 2014, 45 (5), pp.484-490. ⟨10.1016/j.mejo.2014.02.009⟩. ⟨hal-01058582⟩
M. Muñoz Rojo, Stéphane Grauby, Jean-Michel Rampnoux, O. Caballero-Calero, M. Martin-Gonzalez, et al.. Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy. Journal of Applied Physics, 2013, 113 (5), pp.054308 (1-7). ⟨10.1063/1.4790363⟩. ⟨hal-00805572⟩
Karim Aissou, Jonah Shaver, Guillaume Fleury, Gilles Pécastaings, Cyril Brochon, et al.. Nanoscale Block Copolymer Ordering Induced by Visible Interferometric Micropatterning: A Route towards Large Scale Block Copolymer 2D Crystals. Advanced Materials, 2013, 25 (2), pp.213-217. ⟨10.1002/adma.201203254⟩. ⟨hal-00817443⟩
Stéphane Grauby, Etienne Puyoo, Jean-Michel Rampnoux, Emmanuelle Rouvière, Stefan Dilhaire. Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy. Journal of Physical Chemistry C, 2013, 117 (17), pp.9025-9034. ⟨10.1021/jp4018822⟩. ⟨hal-00825416⟩
Stefan Dilhaire, Gilles Pernot, Gaëtan Calbris, Jean-Michel Rampnoux, Stéphane Grauby. Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology. Journal of Applied Physics, 2011, 110 (11), pp.114314 (1-13). ⟨10.1063/1.3665129⟩. ⟨hal-00668320⟩
Josep Altet, Diego Mateo, Xavier Perpinya, Stéphane Grauby, Stefan Dilhaire, et al.. Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring. Review of Scientific Instruments, 2011, 82, pp.094902 (4). ⟨10.1063/1.3633957⟩. ⟨hal-00635099⟩
Etienne Puyoo, Stéphane Grauby, Jean-Michel Rampnoux, Emmanuelle Rouvière. Scanning thermal microscopy of individual silicon nanowires. Journal of Applied Physics, 2011, 109 (2), pp.024302 (9). ⟨10.1063/1.3524223⟩. ⟨hal-00608844⟩
Etienne Puyoo, Stéphane Grauby, Jean-Michel Rampnoux, Emmanuelle Rouvière, Stefan Dilhaire. Thermal exchange radius measurement: Application to nanowire thermal imaging. Review of Scientific Instruments, 2010, 81 (7), pp.073701 (1-5). ⟨10.1063/1.3455214⟩. ⟨hal-00505488⟩
Eduardo Aldrete-Vidrio, Diego Mateo, Josep Altet, M. Amine Salhi, Stéphane Grauby, et al.. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. Measurement Science and Technology, 2010, 21 (7), pp.075104 (10). ⟨10.1088/0957-0233/21/7/075104⟩. ⟨hal-00609286⟩
Stéphane Grauby, Luis-David Patino Lopez, Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, et al.. Joule expansion imaging techniques on microlectronic devices. Microelectronics Journal, 2009, 40 (9), pp.1367-1372. ⟨10.1016/j.mejo.2008.04.016⟩. ⟨hal-00670328⟩
Stéphane Grauby, Amine Salhi, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire. Fast Laser Scanning Imaging System for Surface Displacement Measurements. IEEE Electron Device Letters, 2009, 30 (3), pp.222-224. ⟨10.1109/LED.2008.2012177⟩. ⟨hal-00506112⟩
J. Altet, E. Aldrete-Vidrio, D. Mateo, A. Salhi, Stéphane Grauby, et al.. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. Review of Scientific Instruments, 2009, 80 (2), pp.026101 (1-3). ⟨10.1063/1.3073963⟩. ⟨hal-00505869⟩
Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, Xavier Perpiñà, Xavier Jordà, et al.. A Heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits. Measurement Science and Technology, 2008, 19 (11), pp.115704 (1-8). ⟨10.1088/0957-0233/18/11/115704⟩. ⟨hal-00719197⟩
Stéphane Grauby, Amine Salhi, Luis-David Patino Lopez, Wilfrid Claeys, Benoît Charlot, et al.. Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectronics Reliability, 2008, 48 (2), pp.204-211. ⟨10.1016/j.microrel.2007.04.008⟩. ⟨hal-00747235⟩
S. Grauby, A. Salhi, Jean-Michel Rampnoux, Hélène Michel, W. Claeys, et al.. Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices. Review of Scientific Instruments, 2007, 78 (7), pp.074902 (1-8). ⟨10.1063/1.2757473⟩. ⟨hal-01553046⟩
Y. Ezzahri, S. Dilhaire, L. D. Patino-Lopez, S. Grauby, W. Claeys, et al.. Dynamical behavior and cut-off frequency of Si/SiGe microcoolers. Superlattices and Microstructures, 2007, 41 (1), pp.7-16. ⟨10.1016/j.spmi.2006.08.006⟩. ⟨hal-01553053⟩
Y. Ezzahri, S. Grauby, S. Dilhaire, Jean-Michel Rampnoux, W. Claeys. Cross-plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics. Journal of Applied Physics, 2007, 101 (1), pp.7. ⟨10.1063/1.2403236⟩. ⟨hal-01553054⟩
Younès Ezzahri, Stéphane Grauby, Jean-Michel Rampnoux, Hélène Michel, Gilles Pernot, et al.. Coherent phonons in Si/ SiGe superlattices. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2007, 75 (19), pp. 195309. ⟨10.1103/PhysRevB.75.195309⟩. ⟨hal-01535961⟩
Jean-Michel Rampnoux, H. Michel, M. A. Salhi, Stéphane Grauby, W. Claeys, et al.. Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability, 2006, 46 (9-11), pp.1520-1524. ⟨10.1016/j.microrel.2006.07.029⟩. ⟨hal-01552888⟩
Y. Ezzahri, S. Dilhaire, Stéphane Grauby, Jean-Michel Rampnoux, W. Claeys, et al.. Study of thermomechanical properties of Si/SiGe superlattices using femtosecond transient thermoreflectance technique. Applied Physics Letters, 2005, 87 (10), pp.103506 (1-3). ⟨10.1063/1.2009069⟩. ⟨hal-01552727⟩
Stéphane Grauby, A. Salhi, W. Claeys, D. Trias, S. Dilhaire. ElectroStatic Discharge fault localization by laser probing. Microelectronics Reliability, 2005, Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2005), 45 (9-11), pp.1482-1486. ⟨10.1016/j.microrel.2005.07.038⟩. ⟨hal-01552716⟩
Y. Ezzahri, L.D. Patino Lopez, Pierre-Olivier Chapuis, S. Dilhaire, Stéphane Grauby, et al.. Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers. Superlattices and Microstructures, 2005, 38 (1), pp.69-75. ⟨10.1016/j.spmi.2005.04.005⟩. ⟨hal-00116282⟩
S. Dilhaire, Stéphane Grauby, W. Claeys. Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis. IEEE Electron Device Letters, 2005, 26 (7), pp.461-463. ⟨10.1109/led.2005.851090⟩. ⟨hal-01552734⟩
L. D. P. Lopez, S. Dilhaire, Stéphane Grauby, M. A. Salhi, Y. Ezzahri, et al.. Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement. Journal of Physics D: Applied Physics, 2005, SPECIAL CLUSTER: SELECTED PAPERS FROM MICROSCALE HEAT TRANSFER 2 (Eurotherm Seminar 75, Reims, France, 8–10 July 2003), 38 (10), pp.1489-1497. ⟨10.1088/0022-3727/38/10/001⟩. ⟨hal-01550873⟩
Stéphane Grauby, S. Dilhaire, S. Jorez, W. Claeys. Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging. IEEE Electron Device Letters, 2005, 26 (2), pp.78-80. ⟨10.1109/led.2004.841468⟩. ⟨hal-01552717⟩
L. D. P. Lopez, Stéphane Grauby, S. Dilhaire, M. A. Salhi, W. Claeys, et al.. Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectronics Journal, 2004, 35 (10), pp.797-803. ⟨10.1016/j.mejo.2004.06.010⟩. ⟨hal-01550876⟩
S. Dilhaire, Stéphane Grauby, W. Claeys, J. C. Batsale. Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectronics Journal, 2004, 35 (10), pp.811-816. ⟨10.1016/j.mejo.2004.06.012⟩. ⟨hal-01550923⟩
S. Dilhaire, Stéphane Grauby, S. Jorez, W. Claeys. Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Transactions on Reliability, 2004, 53 (2), pp.293-296. ⟨10.1109/tr.2004.829165⟩. ⟨hal-01551924⟩
L. D. Patino-Lopez, M. A. Salhi, S. Dilhaire, Stéphane Grauby, Jean-Michel Rampnoux, et al.. Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement. Superlattices and Microstructures, 2004, 35 (3-6), pp.375-387. ⟨10.1016/j.spmi.2003.09.003⟩. ⟨hal-01551890⟩
S. Dilhaire, Stéphane Grauby, W. Claeys. Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions. Applied Physics Letters, 2004, 84 (5), pp.822-824. ⟨10.1063/1.1645326⟩. ⟨hal-01551923⟩
J. Altet, Jean-Michel Rampnoux, J. C. Batsale, S. Dilhaire, A. Rubio, et al.. Applications of temperature phase measurements to IC testing. Microelectronics Reliability, 2004, 44 (1), pp.95-103. ⟨10.1016/s0026-2714(03)00138-0⟩. ⟨hal-01551927⟩
G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, et al.. Application of picosecond ultrasonics to non-destructive analysis in VLSI circuits. Microelectronics Reliability, 2003, 43 (9-11), pp.1803-1807. ⟨10.1016/s0026-2714(03)00307-x⟩. ⟨hal-01550917⟩
S. Dilhaire, A. Salhi, Stéphane Grauby, W. Claeys. Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability, 2003, 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2003), 43 (9-11), pp.1609-1613. ⟨10.1016/s0026-2714(03)00282-8⟩. ⟨hal-01550922⟩
Stéphane Grauby, S. Dilhaire, S. Jorez, L. D. P. Lopez, Jean-Michel Rampnoux, et al.. Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique. Applied optics, 2003, 42 (10), pp.1763-1768. ⟨10.1364/ao.42.001763⟩. ⟨hal-01550902⟩
Stéphane Grauby, S. Dilhaire, S. Jorez, W. Claeys. Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices. Review of Scientific Instruments, 2003, 74 (1), pp.645-647. ⟨10.1063/1.1520316⟩. ⟨hal-01550783⟩
J. Altet, S. Dilhaire, S. Volz, Jean-Michel Rampnoux, A. Rubio, et al.. Four different approaches for the measurement of IC surface temperature: application to thermal testing. Microelectronics Journal, 2002, 33 (9), pp.689-696. ⟨10.1016/S0026-2692(02)00051-4⟩. ⟨hal-01550815⟩
S. Dilhaire, Stéphane Grauby, S. Jorez, L. D. P. Lopez, Jean-Michel Rampnoux, et al.. Surface displacement imaging by interferometry with a light emitting diode. Applied optics, 2002, 41 (24), pp.4996-5001. ⟨10.1364/AO.41.004996⟩. ⟨hal-01550826⟩
S. Dilhaire, Stéphane Grauby, S. Jorez, L. D. P. Lopez, E. Schaub, et al.. Laser diode COFD analysis by thermoreflectance microscopy. Microelectronics Reliability, 2001, 41 (9-10), pp.1597-1601. ⟨10.1016/S0026-2714(01)00196-2⟩. ⟨hal-01550687⟩

Communications dans un congrès16 documents

Stéphane Grauby, E. Puyoo, M. M. Rojo, M. Martin-Gonzalez, W. Claeys, et al.. Effect of Nanostructuration on the Thermal Conductivity of Thermoelectric Materials. 19th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), Sep 2013, Berlin, Germany. pp.73-78, ⟨10.1109/THERMINIC.2013.6675191⟩. ⟨hal-01555675⟩
Georges Hadziioannou, K. Aissou, G. Fleury, G. Pecastaings, C. Brochon, et al.. Directed self assembling of block copolymers and their applications to ultra high density magnetic storage and maskless nano lithography. 246th National Meeting of the American-Chemical-Society (ACS), Sep 2013, Indianapolis (IN), United States. ⟨hal-01840904⟩
J. Altet, J. L. Gonzalez, D. Gomez, X. Perpiñà, Stéphane Grauby, et al.. Electro-thermal characterization of a differential temperature sensor and the thermal coupling in a 65nm CMOS IC. 18th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 2012, Sep 2012, Budapest, Hungary. pp.61-66. ⟨hal-01555439⟩
Hélène Fremont, S. Moutault, I. Bord, B. Caillard, Francois Demontoux, et al.. Mise en place d'une pédagogie d'apprentissage par problèmes au département GEII de l'IUT Bordeaux. 8ème Colloque sur l'enseignement des Technologies et des Sciences de l'Information et des Systèmes, Mar 2010, Grenoble, France. Papier N° 58. ⟨hal-00467949⟩
S. Dilhaire, Jean-Michel Rampnoux, Stéphane Grauby, G. Pernot, G. Calbris. Nanoscale Thermal Transport Studied With Heterodyne Picosecond Thermoreflectance. ASME 2009 Second International Conference on Micro/Nanoscale Heat and Mass Transfer, Dec 2009, Shanghai, China. pp.451-456, ⟨10.1115/MNHMT2009-18338⟩. ⟨hal-01554476⟩
S. Grauby, A. Salhi, Jean-Michel Rampnoux, W. Claeys, S. Dilhaire. Laser Scanning Thermomechanical Imaging of Microelectronic Devices. Thermal Inveatigation of ICs and Systems, 2008. THERMINIC 2008. 14th International Workshop on, Sep 2008, Rome, Italy. pp.183-189, ⟨10.1109/THERMINIC.2008.4669905⟩. ⟨hal-01553682⟩
E. Aldrete-Vidrio, M. A. Salhi, J. Altet, Stéphane Grauby, D. Mateo, et al.. Using temperature as observable of the frequency response of RF CMOS amplifiers. 2008 13th European Test Symposium, May 2008, Verbania, Italy. pp.47-52, ⟨10.1109/ets.2008.15⟩. ⟨hal-01840908⟩
S. Grauby, L.-D. Patino Lopez,, A. Salhi, E. Puyoo, J.-M. Rampnoux, et al.. Joule Expansion Imaging Techniques on Microlectronic Devices. THERMINIC 2007, Sep 2007, Budapest, Hungary. pp.174-179. ⟨hal-00202556⟩
L. D. Patino-Lopez, Stéphane Grauby, Y. Ezzahri, W. Claeys, S. Dilhaire. Harmonic regime analysis and inverse method applied to the simultaneous determination of thermoelectric properties. 25th International Conference on Thermoelectrics (ICT'06), Aug 2006, Vienne, Austria. pp.311-317, ⟨10.1109/ICT.2006.331214⟩. ⟨hal-01552885⟩
Y. Ezzahri, Stéphane Grauby, S. Dilhaire, Jean-Michel Rampnoux, W. Claeys, et al.. Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique. THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. pp.235-243. ⟨hal-00189478⟩
Stéphane Grauby, A. Salhi, L.D. Patino Lopez, S. Dilhaire, B. Charlot, et al.. Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques. THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. pp.284-289. ⟨hal-00189487⟩
Y. Ezzahri, S. Dilhaire, Stéphane Grauby, L. D. Patino-Lopez, W. Claeys, et al.. Simulation of Si/SiGe micro-cooler by thermal quadrupoles method. 24th International Conference on Thermoelectrics (ICT), Jun 2005, Clemson, SC, United States. pp.241-245, ⟨10.1109/ICT.2005.1519932⟩. ⟨hal-01552747⟩
S. Dilhaire, Y. Ezzahri, Stéphane Grauby, W. Claeys, J. Christofferson, et al.. Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures. 22nd International Conference on Thermoelectrics (ICT 03), Aug 2003, La Grande Motte, France. pp.519-523, ⟨10.1109/ICT.2003.1287563⟩. ⟨hal-01550927⟩
S. Dilhaire, L. D. Patino-Lopez, Stéphane Grauby, Jean-Michel Rampnoux, S. Jorez, et al.. Determination of ZT of PN thermoelectric couples by AC electrical measurement. 21st International Conference on Thermoelectrics (ICT 02), Aug 2002, Long Beach (CA), United States. pp.321-324, ⟨10.1109/ict.2002.1190330⟩. ⟨hal-01550828⟩
L. D. Patino-Lopez, S. Dilhaire, Stéphane Grauby, S. Jorez, W. Claeys, et al.. Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement. 20th International Conference on Thermoelectrics (ICT 2001), Jun 2001, Beijing, China. pp.499-502, ⟨10.1109/ict.2001.979940⟩. ⟨hal-01550649⟩
S. Jorez, S. Dilhaire, L. P. Lopez, Stéphane Grauby, W. Claeys, et al.. Strain imaging in thermoelectric devices by laser probe shearography. 20th International Conference on Thermoelectrics (ICT 2001), Jun 2001, Beijing, China. pp.503-506, ⟨10.1109/ICT.2001.979941⟩. ⟨hal-01550644⟩

Poster de conférence1 document

Aymen Ben Amor, M. Fakhfakh, C. Renard, Stefan Dilhaire, Laetitia Vincent, et al.. Thermal conductivity reduction measurement on Ge and Si NWs: heterostructuration and diameter size effect.. 15ème Colloque de la Société Française des Microscopies, Jul 2017, Bordeaux, France. . ⟨hal-01700572⟩

1. S. Grauby, B.C. Forget, S. Holé and D. Fournier, Review of Scientific Instruments 70, 3603-3608 (1999).

2. S. Dilhaire, S. Grauby, S. Jorez, L.D. Patino Lopez, J-M. Rampnoux and W. Claeys, Applied Optics 41, 4996-5001 (2002).

3. S. Dilhaire, S. Grauby and W. Claeys, Applied Physics Letters 84, 822-824 (2004).

4. S. Grauby, S. Dilhaire, S. Jorez and W. Claeys, IEEE Electron Device Letters 26, 78-80 (2005).

5. S. Grauby, A. Salhi, J-M. Rampnoux, H. Michel, W. Claeys and S. Dilhaire, Review of Scientific Instruments 78, 074902 (2007).

6. S. Grauby, A. Salhi, J-M. Rampnoux, W. Claeys and S. Dilhaire, IEEE Electron Device Letters 30, 222-224 (2009).

7. E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière and S. Dilhaire, Review of Scientific Instruments 81, 073701 (2010).

8. E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière and S. Dilhaire, Journal of Applied Physics 109, 024302 (2011).

9. K. Aissou, J. Shaver, G. Fleury, G. Pécastaings, C. Brochon, C. Navarro, S. Grauby, J-M. Rampnoux, S. Dilhaire and G. Hadziioannou, Advanced Materials 25, 213-217 (2013).

10. M. Munoz Rojo, S. Grauby, J-M. Rampnoux, O. Caballero-Calero, M. Martin-Gonzalez, and S. Dilhaire, Journal of Applied Physics 113, 054308 (2013).

11. S. Grauby, E. Puyoo, J-M. Rampnoux, E. Rouvière, and S. Dilhaire, Journal of Physical Chemistry C 117, 9025 (2013).

12. M. Munoz Rojo, J. Martin, S. Grauby, T. Borca-Tasciuc, S. Dilhaire and M. Martin-Gonzalez, “Decrease in Thermal Conductivity in Polymeric P3HT Nanowires by Size-Reduction induced by Crystal Orientation: New Approaches towards Organic Thermal Transport Engineering”, Nanoscale, DOI: 10.1039/C4NR00107A (2014).

Curriculum vitae

1. Trajectoire professionnelle

Fonction actuelle : maître de conférences HDR, Bordeaux 1, 63^ème section, 6^ème échelon (classe normale).
1999-2000 : ATER Paris 11.

2. Cursus et diplômes universitaires

1993-1996 : Ecole d’ingénieurs, ENST (Télécom Paris).
1995-1996 : DEA Electronique, option optoélectronique et microondes, Paris 6/ENST, Mention Bien.
Thèse : Université Paris 6/ENST, soutenue le 20/01/2000,

Titre : Imagerie photothermique de photoréflectance haute fréquence utilisant une caméra CCD visible couplée à une détection synchrone multiplexée.

Habilitation à diriger des recherches : Université Bordeaux 1, soutenue le 26/09/2011,

Titre : Imagerie thermique (optique et à sonde locale) : du microsystème au nanomatériau.

3. Activités de recherche

Activités pluridisciplinaires : instrumentation, optique, électronique, thermique, matériaux.
Thèmes de recherche :

– Imagerie thermique optique (thermoréflectance, interférométrie)

– Imagerie thermique à sonde locale : microscopie thermique à balayage (SThM), microscopie de dilatation de surface (SJEM).

4. Activités d’enseignement et d’encadrement

Enseignement en DUT GEII (Génie Electrique et Informatique Industrielle) 1^ère et 2^ème année, service annuel moyen : 250 heures. Matières enseignées : cours et TD de physique pour les électroniciens (électrostatique, magnétisme, physique des semi-conducteurs, optoélectronique, propagation hyperfréquences) et TP d’électronique analogique et numérique.
Co-responsable de la licence professionnelle « Métiers de la Microélectronique et des Microsystèmes ».