Tips and Photons Imaging

LOGO TiPI

 

 

Présentation

Le groupe étudie l’interaction entre la lumière, la chaleur et l’électricité dans les nano-matériaux et les micro-systèmes. Nous développons des techniques d’imagerie innovantes utilisant des pointes de champ proche associées (ou non) à des lasers femtoseconde.

Du transfert de Technologie à la Physique Fondamentale…

Le savoir-faire du groupe consiste à développer des nouvelles techniques d’imagerie aux nano-échelles avec des résolutions temporelles femtoseconde (à titre d’exemple : là où il faudrait d’ordinaire 40 heures pour obtenir un signal en un point unique, 10 minutes suffisent pour enregistrer un film du passage d’une onde de chaleur à la vitesse de la lumière à la cadence de 40 Téra images à la seconde).

Thèmes de recherche

Cette nouvelle technique associée à de l’imagerie de champ proche permet de revisiter des domaines de la physique fondamentale :

  • Nano Phononique (LOMA-I2M) : Nanothermie, Acoustique picoseconde, SThM, Identification de propriétés thermiques de nano-matériaux (nano-fils, super-réseaux, couches minces).
  • Nano Plasmonique (LOMA-LP2N) : Imagerie avancée via les plasmons de surface, confinement de la lumière pour dépasser la limite de diffraction optique.
  • Imagerie Thermique Optique et de Champ Proche (LOMA-IMS) : Analyse de défaillance de composants opto-électroniques pour les applications spatiales.
  • Transfert de Technologie (LOMA-Amplitude Systèmes) : Développement de nouvelles techniques d’imagerie ultra-rapide à base d’échantillonnage optique hétérodyne.
Membres de la thématique TIPI

Membres de la thématique TIPI

La thématique est composée des membres suivants :

Anciens membres de la thématique :

 

Tips & Photons

Tips & Photons

Nanoplasmonique

Nanoplasmonique

 

Résultats

Informations à venir…

Publications

Brevet

Demande de Déclaration d’invention Ref CNRS 00337-01 intitulée « Echantillonnage optique hétérodyne », avis favorable du Comité des Engagements du 12 juillet 2005.

 Publications

2011

E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière, S. Dilhaire, “Scanning thermal microscopy of individual silicon nanowires”, J. Appl. Phys., vol. 109, 024302 (2011).

 2010

E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière, S. Dilhaire, “Thermal exchange radius measurement : application to nanowire thermal imaging”, Rev. Sci. Instrum., vol. 81, 073701 (2010).

J. Altet, E. Aldrete, D. Mateo, X. Perpiñà, X. Jordà, M. Vellvehi, J. Millan, A. Salhi, S. Grauby, W. Claeys, S. Dilhaire, “Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements”, Meas. Sci. Technol., vol. 21, 075104 (2010).

2009

C. Pradère, J-C. Batsale, J-M. Goyhénèche, R. Pailler, S. Dilhaire, “Thermal properties of carbon fibers at very high temperature”, Carbon, vol. 47, pp. 737-743 (2009).

S. Grauby, L-D. Patino Lopez, A. Salhi, E. Puyoo, J-M. Rampnoux, W. Claeys and S. Dilhaire, “Joule Expansion Imaging Techniques on Microlectronic Devices”, Microelectronics Journal, vol. 40, pp. 1367-1372 (2009).

S. Grauby, A. Salhi, J-M. Rampnoux, W. Claeys and S. Dilhaire, “Fast Laser Scanning Imaging System for Surface Displacement Measurements”, IEEE Electron Device Letters, vol. 30, pp. 222-224 (2009).

J. Altet, E. Aldrete-Vidrio, D. Mateo, A. Salhi, S. Grauby, W. Claeys, S. Dilhaire, X. Perpiñà, and X. Jordà, “Heterodyne lock-in thermal coupling measurements in integrated circuits : applications to test and characterization”, Review of Scientific Instruments, vol. 80, 026101 (2009).

2008

J. Altet, E. Aldrete, D. Mateo, X. Perpiñà, X. Jordà, M. Vellvehi, J. Millan, A. Salhi, S. Grauby, W. Claeys, S. Dilhaire, “Heterodyne method for the thermal observation of the electrical behavior of high frequency integrated circuits”, Meas. Sci. Technol., vol. 19, 115704 (2008).

S. Grauby, A. Salhi, L-D. Patino Lopez, W. Claeys, B. Charlot and S. Dilhaire, “Comparison of Thermoreflectance and Scanning Thermal Microscopy for Microelectronic Device Temperature Variation Imaging : Calibration and Resolution Issues”, Microelectronics Reliability, vol. 48, pp. 204-211 (2008).

2007

S. Grauby, A. Salhi, J-M. Rampnoux, H. Michel, W. Claeys and S. Dilhaire, “Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices”, Review of Scientific Instruments, vol. 78, 074902 (2007).

Y. Ezzahri, S. Grauby, J.M. Rampnoux, H. Michel, G. Pernot, W. Claeys, S. Dilhaire, C. Rossignol, G. Zeng and A. Shakouri, « Coherent phonons in Si/SiGe superlattices », Phys. Rev. B, vol. 75, pp. 195309 (2007).

Y. Ezzahri, S. Grauby, S. Dilhaire, J. M. Rampnoux and W. Claeys, « Cross-Plan Si/SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics », J. Appl. Phys., vol. 101, pp. 013705 (2007).

Y. Ezzahri, S. Dilhaire, L. D. Patiño Lopez, S. Grauby, W. Claeys, Z. Bian, Y. Zhang and A. Shakouri, « Dynamical Behavior and Cut-Off Frequency of Si/SiGe Microcoolers”, Superlattices and Microstructures, vol. 41, pp. 7-16 (2007).

2006

J.M. Rampnoux, H. Michel, M. A. Salhi, S. Grauby, W. Claeys, S. Dilhaire, “Time gating imaging through thick silicon substrate : a new step towards backside characterisation.”, Microelectronics Reliability, vol. 46, pp. 1520-24, 2006 (ESREF 2006).

C. Pradère, J-M. Goyhénèche, J-C. Batsale, S. Dilhaire, R. Pailler, “Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature”, International Journal of Thermal Sciences, vol. 45, pp. 443-451 (2006).

C. Rossignol, J.M. Rampnoux, T. Dehoux, S. Dilhaire, B. Audoin, “Picosecond ultrasonics time resolved spectroscopy using a photonic crystal fiber”, Rev. Sci. Instrum.., vol. 77, 033101 (2006).

2005

S. Grauby, A. Salhi, W. Claeys, D. Trias and S. Dilhaire, “ElectroStatic Discharge Fault Localization by Laser Probing”, Microelectronics Reliability, Vol. 45, Issues 9-11, pp. 1482-1486 (2005) (ESREF 2005).

Y. Ezzahri, S. Dilhaire, S. Grauby, J. M. Rampnoux, W. Claeys, Y. Zhang, G. Zeng, and A. Shakouri, « Study of Thermomechanical Properties of Si/SiGe Superlattices using Femtosecond Transient Thermoreflectance Technique », Applied Physics Letters 87,103506 (2005).

Y. Ezzahri, L. D. Patiño Lopez, O. Chapuis, S. Dilhaire, S. Grauby, W. Claeys and S. Volz, “Dynamical Behavior of the Scanning Thermal Microscope (SThM) Thermal Resistive Probe using Si/SiGe Microcoolers”, Superlattices and Microstructures, vol. 38, pp. 69-75 (2005).

S. Dilhaire, S. Grauby and W. Claeys, “Thermoreflectance calibration procedure on a laser diode : application to COFD analysis”, IEEE Electron Device Letters, vol. 26, n°7, pp. 461-463 (2005).

C. Rossignol, J.M. Rampnoux, M. Perton, B. Audoin, S. Dilhaire, “Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses”, Phys. Rev. Lett., vol. 94, 166106 (2005)

C. Rossignol, B. Audoin, J.M. Rampnoux, S. Dilhaire, W. Claeys, “Effect of the laser pulse duration on picosecond ultrasonic signals”, Acta Acustica united with Acustica., vol. 91, pp. 689-692 (2005)

C. Pradère, J-C. Batsale, J-M. Goyhénèche, R. Pailler, S. Dilhaire, “Specific heat measurement of single metallic, carbon, and ceramic fibers at very high temperature”, Rev. Sci. Instrum.., vol. 76, pp. 1-6 (2005).

L-D. Patino Lopez, S. Dilhaire, S. Grauby, M.A. Salhi and W. Claeys, “Characterization of thermoelectric devices by Laser Induced Seebeck ElectroMotive Force (LIS-EMF) measurement”, Journal of Physics D : Applied Physics, 2ème proceedings Eurotherm 2003, vol. 38, pp. 1489-97 (2005).

S. Grauby, S. Dilhaire, S. Jorez and W. Claeys, “Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging”, IEEE Electron Device Letters, vol. 26, n°2, pp. 78-80 (2005).

2004

S. Dilhaire, S. Grauby, J.C. Batsale, W. Claeys, “Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy”, Microelectronics Journal, vol. 35, pp. 811-816 (2004).

Luis-David Patiño-Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sébastian Volz, « Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope », Microelectronics Journal, proceedings Therminic 2003, vol. 35, pp. 797-803 (2004).

L-D. Patino Lopez, A. Salhi, S. Dilhaire, S. Grauby, J-M. Rampnoux, S. Jorez and W. Claeys, “Thermal study of PN thermoelectric couple by laser induced Seebeck emf measurement”, Superlattices and Microstructures, proceedings Eurotherm 2003, vol. 35, pp. 375-387 (2004).

S. Dilhaire, S. Grauby, S. Jorez and W. Claeys, “Strain energy imaging of a power MOS transistor using speckle interferometry”, IEEE Transactions on Reliability, vol. 53, n°2, pp. 293-296 (2004).

S. Dilhaire, Y. Ezzahri, S. Grauby, and W. Claeys, J. Christofferson, Y. Zhang and A. Shakouri, “Thermal and Thermomechanical Study of Micro-refrigerators on a Chip based on Semiconductor Heterostructures”, proceedings-ICT’03-22nd International Conference on Thermoelectrics IEEE, pp. 519-523 (2004)

J. Altet, M. A. Salhi, S. Dilhaire and A. Ivanov, “Calibration-free heat source localisation in ICs entirely covered by metal layers”, Electronics Letters, Vol. 40, n°4, pp. 241-242 (2004).

S. Dilhaire, S. Grauby and W. Claeys, “Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions”, Appl. Phys. Lett., vol. 84, n°5, pp. 822-824 (2004).

J. Altet, JM Rampnoux, JC Batsale, S. Dilhaire, A. Rubio, W. Claeys, S. Grauby, “Application of temperature phase measurements to IC testing”, Microelectronics Reliability, Vol 44, pp. 95-103 (2004).

2003

J. Altet, M.A. Salhi, S. Dilhaire, A. Syal and A. Ivanov, “Localisation of devices acting as heat sources in ICs covered entirely by metal layers”, Electronics Letters, Volume 39, pp. 1440-1442 (2003).

G. Marinier, S. Dilhaire, L-D Patiño-Lopez and M. Benzohra, “Determination of passive SiO2-Au microstructure resonant frequencies”, Microelectronics Reliability, Volume 43, Issues 9-11, September-November 2003, pp. 1951-1955 (ESREF 2003).

G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, B. Audoin, “Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits”, Microelectronics Reliability, Volume 43, Issues 9-11, September-November 2003, Pages 1803-1807. (ESREF 2003)

Stefan Dilhaire, Amine Salhi, Stéphane Grauby and Wilfrid Claeys, “Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI) : complementary investigation methods.”, Microelectronics Reliability, Volume 43, Issues 9-11, September-November 2003, Pages 1609-1613. (ESREF 2003)

S. Grauby, S. Dilhaire, S. Jorez, L. D. Patino Lopez, J.-M. Rampnoux, and W. Claeys, “Measurement of thermally induced vibrations of microelectronics devices using an heterodyne ESPI imaging technique”, vol 42, N°10, Applied Optics, 01/04/03, 1763-1768.

S. Grauby, S. Dilhaire, S. Jorez and W. Claeys, “Imaging set up for temperature, topography and surface displacement measurements of microelectronic devices”, vol 74, N°1, Review of Scientific Instruments, 645-647 (2003)( special issue Proceedings of XIIth ICPPP Toronto 24-27 June 2002).

2002

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patino Lopez, Jean-Michel Rampnoux and Wilfrid Claeys, “Surface displacement imaging by interferometry using a light emitting diode (LED)”, vol 41, N° 24, Applied Optics, 20/08/02, 4996-5001.

J. Altet, S. Dilhaire, S. Volz, JM Rampnoux, A. Rubio, S. Grauby, LD Patino Lopez, W. Claeys, JB Saulnier, “Four different approaches for the measurement of IC surface temperature : application to thermal testing”, Microelectronics Journal, 2002, 689-696 (Therminic 2001, 24-27 sept 2001, Paris).

W. Claeys, S. Dilhaire, S. Jorez and S. Grauby, « Optical instrumentation for the thermal characterization of electronic devices », Electronics Cooling, vol 8, N°3, Aug. 2002, 24-32.

J. Altet, S. Dilhaire, S. Grauby and S. Volz, « Advanced techniques for IC surface temperature measurement », Electronics Cooling, vol 8, N°1, Feb. 2002, 22-28.

S. Jorez, S. Dilhaire, L-D. Patino Lopez et W. Claeys, “Imagerie de déformation par shearographie. Application à l’électronique de puissance”, REE, Revue de l’Electricité et de l’Electronique, n° 5, Juin 2002, pp. 1-4.


 

Conférences

O : oral, I : invité, A : affiche.

 2010

E. Puyoo, S. Grauby, J-M. Rampnoux, W. Claeys, E. Rouvière, S. Dilhaire, “Simultaneous topographic and thermal imaging of silicon nanowires using a new SThM probe”, THERMINIC’S, 6-8 octobre, Barcelone, Spain, 2010, O.

G. Calbris, J. Shaver, G. Pernot, H. Michel, J-M. Rampnoux, S. Ravaine, S. Dilhaire, “Multi-Color Transient Picosecond Thermoreflectance Imaging”, Laser Ultrasonics, 5-8 juillet, Talence, France, 2010, O.

G. Pernot, G. Calbris, J. Shaver, H. Michel, S. Grauby, J-M. Rampnoux, S. Dilhaire, “Heterodyne Thermorelectance Spectroscopy as a Probe of Heat Transfer in Si/SiGe Superlattices”, Laser Ultrasonics, 5-8 juillet, Talence, France, 2010, A.

J. Shaver, G. Pernot, G. Calbris, H. Michel, S. Grauby, J-M. Rampnoux, S. Dilhaire, “Heterodyne Terahertz Coherent Phonon Spectroscopy of Si/SiGe Superlattices”, Laser Ultrasonics, 5-8 juillet, Talence, France, 2010, O.

2009

S. Dilhaire, J-M. Rampnoux, S. Grauby, G. Pernot, G. Calbris, “Nanoscale thermal transport studied with heterodyne picosecond thermoreflectance”, Micro/Nano Heat and Mass Transfer International Conference, 18-21 décembre, Shanghai, China, 2009, O.

S. Dilhaire, J-M. Rampnoux, , S. Grauby, G. Pernot, G. Calbris, W. Claeys, “Nanoscale thermal management by way of heterodyne picosecond thermoreflectance”, ICPPP 15, 19-23 juillet, Leuven , Belgium, 2009, I.

S. Dilhaire, “Thermophysical properties identification of nanomaterials”, University of California Santa Cruz, USA, 2009, I.

2008

E. Puyoo, S. Grauby, J-M. Rampnoux, E. Rouvière, W. Claeys, S. Dilhaire, “Thermal characterization of silicon nanowires”, Nanoswec, 3-5 novembre, Bordeaux, France, 2008, A.

S. Grauby, A. Salhi, J-M. Rampnoux, W. Claeys, S. Dilhaire, “Laser scanning thermomechanical imaging of microelectronic devices”, THERMINIC’S, 24-26 septembre, Rome, Italy, 2008, O.

S. Grauby, G. Tessier, D. Fournier, S. Dilhaire, “Thermoreflectance imaging techniques”, THERMINIC’S, 24-26 septembre, Rome, Italy, 2008, I.

S. Dilhaire, J.-M. Rampnoux, G. Pernot, G. Calbris, S. Grauby, C. Rossignol, S. Ermeneux and E. Mottay, “Photothermal and photoacoustic imaging by ultrafast optical sampling”, 29 juin- 4 juillet, Acoustics’08, Paris, France, 2008, A.

L. Clerjaud, C. Pradère, J.C. Batsale, S. Dilhaire, S. Grauby, “Méthode d’hétérodynage pour la caractérisation d’écoulement microfluidique en gouttes par thermographie infrarouge”, Congrès de la Société Française de Thermique, 3-6 juin, Toulouse, France, 2008, A.

E. Aldrete-Vidrio, A. Salhi, J. Altet, S. Grauby, D. Mateo, H. Michel, L. Clerjaud, J-M. Rampnoux, S. Dilhaire, A. Rubio, W. Claeys, “Using temperature as observable of the frequency response of RF CMOS Amplifiers”, 13th IEEE European Test Symposium, 25-29 may 2008, Lago Maggiore, Italy, 2008, O.

2007

S. Grauby, L-D. Patino Lopez, A. Salhi, J-M. Rampnoux, W. Claeys, S. Dilhaire, “Joule expansion imaging techniques on a microlectronic device”, THERMINIC’S, 17-19 septembre 2007, Budapest, Hungary, 2007, O.

G. Pernot, H. Michel, Y. Ezzahri, S. Dilhaire, J.-M. Rampnoux, L.D. Patino Lopez, S. Grauby, W. Claeys and C. Rossignol, “Phononic Excitation of Folded Acoustic Phonons in SiGe Superlattices”, Phonons 2007, Paris, France, 15-20 juillet 2007, A.

S. Dilhaire, J.-M. Rampnoux, H. Michel, G. Pernot, Y. Ezzahri, S. Grauby, W. Claeys and C. Rossignol, “Phonon Imaging up to 4 Tera Frames per Second by Femtosecond Heterodyne Optical Sampling”, Phonons 2007, Paris, France, 15-20 juillet 2007, O.

S. Dilhaire, JM. Rampnoux, S. Grauby, C. Rossignol, “Phonon transport imaging up to Tera images per second”, 2007 MRS Spring Meeting, Symposium II : Nanoscale Heat Transport—From Fundamentals to Devices, April 9-13, 2007, San Francisco, USA, I.

2006

S. Dilhaire, “Thermal properties measurement of micro and nano material”, International Seminar for Standardization of Thermophysical Property Measurement, Kyoto, Japan, 2006, I.

S. Dilhaire, “Picosecond phonon imaging”, International Workshop on Nanoscale Energy Conversion and Information Processing Devices, Nice, France, 2006, I.

J.M. Rampnoux, H. Michel, M. A. Salhi, S. Grauby, W. Claeys, S. Dilhaire, “Time gating imaging through thick silicon substrate : a new step towards backside characterisation.”, ESREF 2006, 3-6 octobre 2006, Wuppertal, Germany, O.

S. Dilhaire, W. Claeys, S. Grauby, J.M. Rampnoux, Y. Ezzahri,L.D. Patiño-Lopez, A. Sahli, H. Michel, G. Pernot, B. Audoin, C. Rossignol, M. Perton,T. Dehoux,Y. Pan, N. Chigarev, D. Ségur, C. Charles, “Picosecond Phonon imaging”, International Workshop on Nanoscale Energy Conversion and Information Processing Devices, 24-26 September 2006, Nice, France, O.

L-D. Patino Lopez, S. Grauby, Y. Ezzahri, W. Claeys, S. Dilhaire, « Harmonic regime analysis and inverse methods applied to the simultaneous estimation of thermoelectric properties », 25th International Conference on Thermoelectrics, 6-10 August 2006, Vienna, Austria, O.

S. Grauby, Y. Ezzahri, J-M. Rampnoux, H. Michel, W. Claeys, S. Dilhaire, « Détermination des propriétés thermophysiques de superréseaux Si/SiGe par technique pompe-sonde », Congrès de la Société Française de Thermique, 16-19 mai 2006, Ile de Ré, France, A.

2005

S. Dilhaire, “Nano phononics for thermoelectrics”, University of California Santa Cruz, USA, 2005, I.

S. Grauby, A. Salhi, W. Claeys, D. Trias and S. Dilhaire, “ESD fault localization by laser probing”, ESREF 2005, 10-14 octobre 2005, Arcachon, France, O.

Y. Ezzahri, S. Grauby, S. Dilhaire, J. M. Rampnoux, W. Claeys, Y. Zhang, and A. Shakouri, “Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique”, Therminic 2005, 27-30 septembre 2005, Belgirate, Italie, O.

S. Grauby, A. Salhi, L-D. Patino Lopez, S. Dilhaire, B. Charlot, W. Claeys, B. Cretin, S. Gomes, G. Tessier, N. Trannoy, P. Vairac and S. Volz, “Qualitative Temperature Variation Imaging by Thermoreflectance and SThM Techniques”, Therminic 2005, 27-30 septembre 2005, Belgirate, Italie, O.

S. Gomès, O. Chapuis, F. Nepveu, N. Trannoy, S. Volz, B. Charlot, G. Tessier, S. Dilhaire, B. Cretin, P. Vairac, “Temperature Measurement of Microsystems by Scanning Thermal Microscopy”, Therminic 2005, 27-30 septembre 2005, Belgirate, Italie, O.

G. Tessier, S. Pavageau, C. Filloy, B. Charlot, G. Jerosolimski, D. Fournier, B. Cretin, S. Dilhaire, N. Trannoy, P. Vairac, S. Volz, “Quantitative Thermoreflectance Imaging : calibration method and validation on a dedicated integrated circuit”, Therminic 2005, 27-30 septembre 2005, Belgirate, Italie, O.

P. Vairac, B. Cretin, B. Charlot, S. Dilhaire, S. Gomès, G. Tessier, N. Trannoy, S. Volz, “Ultra-local Temperature mapping with an intrinsic thermocouple”, Therminic 2005, 27-30 septembre 2005, Belgirate, Italie, O.

M.A. Salhi, S. Grauby, S. Dilhaire, W. Claeys, D. Trias, “Caractérisation par imagerie interférométrique de composant microélectronique”, 9ème Colloque sur les lasers et l’optique quantique, 7-9 septembre 2005, Dijon, France, A.

Y. Ezzahri, S. Dilhaire, L.D. Patino Lopez, S. Grauby, W. Claeys, Y. Zhang, Z. Bian and A. Shakouri, “Simulation of Si/SiGe micro-cooler by thermal quadrupoles method”, ICT’05, Clemson, USA, 19-23 juin 2005, O.

Y. Ezzahri, L.D. Patino Lopez, S. Dilhaire, S. Grauby, W. Claeys, Y. Zhang and A. Shakouri, “Cut-off frequency of Si/SiGe micro-coolers”, ECT 2005, 1-2 september , Nancy, France, A.

2004

Y. Ezzahri, S. Dilhaire, S. Grauby, J.M. Rampnoux, L.D. Patino Lopez, W. Claeys, Y. Zhang and A. Shakouri, “Study of heat transfer at micro and nano scale by laser probing in thermoelectric microrefrigerators”, 5th France-Japan Workshop on Nanomaterials, 11-13 october 2004, Bordeaux, France, A.

W. Claeys, “Microscale and nanoscale thermometry by reflectance and interferometric methods”, Therminic 2004, Sophia Antipolis, France, 29 september-1st October 2004, invited paper.

J.M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, B. Audoin, G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, « Applications de l’acoustique picoseconde à l’analyse non destructive des circuits intégrés », C2I 2004, Cachan, France, 29-30 janvier 2004, O.

2003

G. Marinier, S. Dilhaire, L-D Patiño-Lopez and M. Benzohra, “Determination of passive SiO2-Au microstructure resonant frequencies”, ESREF 2003, Arcachon, France (8-10 octobre 2003), affiche.

S. Dilhaire, A. Salhi, S. Grauby and W. Claeys, “Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI) : complementary investigation methods”, ESREF 2003, Arcachon, 8-10 octobre 2003.

G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J.M. Rampnoux, Y. Ezzahri, S. Dilhaire, S. Grauby, W. Claeys, C. Rossignol, B. Audoin, “Application of Picosecond Ultrasonics to Non-Destructive Defect Analysis in VLSI circuits”, ESREF 2003, Arcachon, 8-10 octobre 2003.

Luis-David Patiño-Lopez, M. Amine Salhi, Stéphane Lefèvre, Sébastian Volz, Stefan Dilhaire, Stéphane Grauby, Jean-Michel Rampnoux, Sébastien Jorez and Wilfrid Claeys, « Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope », Therminic, Aix en Provence, France, 24-26 septembre 2003.

S. Dilhaire, Y. Ezzahri, S. Grauby, and W. Claeys, J. Christofferson, Y. Zhang and A. Shakouri, “Thermal and Thermomechanical Study of Micro-refrigerators on a Chip based on Semiconductor Heterostructures”, ICT’03, La Grande Motte, France, 17-21 août 2003, poster.

L-D Patino Lopez, A. Salhi, S. Dilhaire, S. Grauby, S. Jorez and W. Claeys, “Thermal diffusivity, thermal conductivity and Seebeck coefficicent determination in thermoelectric systems by laser induced Seebeck emf measurement”, Eurotherm 2003, Reims, France, 8-10 juillet 2003.

S. Jorez, J. Laconte, J.-P. Raskin, A. Cornet, S. Grauby, S. Dilhaire and W. Claeys, “Optical studies for MEMS thermomechanical characterization”, Photonics and Mechanics – Photomec’02, Louvain-la-Neuve, Belgium, February 20-21, 2003, paper 14, 7 p.

2002

W. Claeys, S. Dilhaire, Luis-David Patiño Lopez, S. Grauby, S. Jorez, J.Michel Rampnoux,“New Figure of Merit(Z) Measurement Technique based in Harmonic Regime Analysis”, 7th European Workshop on Thermoelectrics, Pamplona, Espagne, 3-4 octobre 2002.

L-D Patino Lopez, S. Dilhaire, S. Grauby, J.Michel Rampnoux, S. Jorez, and W. Claeys, “Thermal self induction in PN thermoelectric couple. Determination of the dynamic electrical equivalent model.”, Therminic, Madrid, Espagne, 1-4 octobre 2002.

Stefan Dilhaire, Luis-David Patino-Lopez, Stéphane Grauby, Jean-Michel Rampnoux, Sébastien Jorez and Wilfrid Claeys, “Determination of ZT of PN thermoelectric couples by AC electrical measurement”, ICT’02, Long Beach, USA, 25-29 août 2002.

S. Grauby, S. Dilhaire, S. Jorez and W. Claeys, “Imaging set up for temperature, topography and surface displacement measurements of microelectronic devices”, XIIth ICPPP, Toronto, Canada, 24-27 June 2002.